Correction: Corrigendum: Isotope analysis in the transmission electron microscope

Corrigendum: Isotope analysis in the transmission electron microscope

This corrects the article DOI: 10.1038/ncomms13040.

Isotope analysis in the transmission electron microscope

The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the dis...

Electron microscopy’s multi-tool: the Scanning Transmission Electron Microscope

A dedicated Scanning Transmission Electron Microscope is ideally coupled with the energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale. With several signals being available simultaneously with the pass of a subnanometre-sized beam, this instrument can answer questions from a bro...

In situ straining experiments in the transmission electron microscope

Autofocusing and Astigmatism Correction in the Scanning Electron Microscope

This work investigates both the theoretical and practical aspects of autofocusing and astigmatism correction in the scanning electron microscope. A general framework is used to divide the problem into four primary areas of concern: noise reduction, regions of interest, sharpness measures, and maximum sharpness search algorithms. Each of these areas is investigated in detail and several novel co...